Package | Description |
---|---|
com.sun.electric.tool.simulation.test |
Chip-independent test software library for the
Asynchronous Design Group in Oracle Labs, see bottom
for locations of documentation.
|
Modifier and Type | Class and Description |
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class |
ChainNode
Represents an entire scan chain, covering all of the scan chain elements at a
single address on the chip's JTAG controller.
|
class |
ChainNodeDuplicate
Wraps an existing ChainNode with this class to create a duplicate chain node that
is backed with the same data as the original ChainNode.
|
Modifier and Type | Method and Description |
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protected static java.util.List |
NanosimJtag.getDataNets(SubchainNode chain,
int set)
Get a list of DataNets from the chain.
|
protected static java.util.List |
BypassJtagTester.getDataNets(SubchainNode chain,
int set)
Get a list of DataNets from the chain.
|
protected static java.util.List |
NanosimJtag.getDataNetsOld(SubchainNode chain,
int set)
Deprecated.
this was used when the xml file contains data nets specified hierarchically
along with the scan chain bits. I have since split the data nets out into a separate,
flat listing.
|
protected static java.util.List |
BypassJtagTester.getDataNetsOld(SubchainNode chain,
int set)
Deprecated.
this was used when the xml file contains data nets specified hierarchically
along with the scan chain bits. I have since split the data nets out into a separate,
flat listing.
|